User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: Fluke 80TK:Themocouple Module DATE: 14-Nov-97 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 26 NUMBER OF LINES: 215 CONFIGURATION: Fluke 5700A CONFIGURATION: Datron 1281 STANDARD: Omega TRC III ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P M F W 1.002 ASK+ X 1.003 STD Omega TRC III 1.004 IEEE [@1281]*RST 1.005 HEAD ÍÍ INITIAL CONDITIONS ÍÍ 1.006 DISP Insert the reference thermocouple into the center 1.006 DISP well of the Ice Point Cell. 1.007 DISP Connect the copper end (yellow dual banana connector) 1.007 DISP to the 5700 OUTPUT HI/LO. 1.008 DISP Connect a "K" type connector with "K" type T/C wire 1.008 DISP to UUT thermocouple input. 1.009 DISP Connect the 80TK to the input of the Datron. 1.010 HEAD {} 1.011 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 1.012 HEAD {º øC Calibration º} 1.013 HEAD {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 1.014 HEAD ÍÍ øC Calibration ÍÍ 1.015 JMP 2.001 1.016 EVAL 2.001 IEEE [@1281]DCV AUTO 2.002 DISP Select the øC mode on the UUT. 2.003 5700 -1.889mV S 2W 2.004 ACC -50.00ø 8P% 2.005 IEEE [@1281][D3000]RDG?[I] 2.006 MEM* 1000 2.007 MEME 2.008 MEMC øC 3.25U #! Test Tol 3.25, Sys Tol 0.0004, TUR 8125.000 (>= 4.00). 3.001 5700 0.000mV S 2W 3.002 ACC 0.00ø 0.01U 3.003 IEEE [@1281][D3000]RDG?[I] 3.004 MEM* 1000 3.005 MEME 3.006 MEMC øC 2.00U #! Test Tol 2, Sys Tol 0.01, TUR 200.000 (>= 4.00). 4.001 5700 4.096mV S 2W 4.002 ACC 100.00ø 8P% 4.003 IEEE [@1281][D3000]RDG?[I] 4.004 MEM* 1000 4.005 MEME 4.006 MEMC øC 2.50U #! Test Tol 2.5, Sys Tol 0.0008, TUR 3125.000 (>= 4.00). 5.001 5700 8.138mV S 2W 5.002 ACC 200.00ø 8P% 5.003 IEEE [@1281][D3000]RDG?[I] 5.004 MEM* 1000 5.005 MEME 5.006 MEMC øC 3.00U #! Test Tol 3, Sys Tol 0.0016, TUR 1875.000 (>= 4.00). 6.001 5700 12.209mV S 2W 6.002 ACC 300.00ø 8P% 6.003 IEEE [@1281][D3000]RDG?[I] 6.004 MEM* 1000 6.005 MEME 6.006 MEMC øC 3.50U #! Test Tol 3.5, Sys Tol 0.0024, TUR 1458.333 (>= 4.00). 7.001 5700 16.397mV S 2W 7.002 ACC 400.00ø 8P% 7.003 IEEE [@1281][D3000]RDG?[I] 7.004 MEM* 1000 7.005 MEME 7.006 MEMC øC 9.00U #! Test Tol 9, Sys Tol 0.0032, TUR 2812.500 (>= 4.00). 8.001 5700 20.644mV S 2W 8.002 ACC 500.00ø 8P% 8.003 IEEE [@1281][D3000]RDG?[I] 8.004 MEM* 1000 8.005 MEME 8.006 MEMC øC 10.75U #! Test Tol 10.75, Sys Tol 0.004, TUR 2687.500 (>= 4.00). 9.001 5700 24.905mV S 2W 9.002 ACC 600.00ø 8P% 9.003 IEEE [@1281][D3000]RDG?[I] 9.004 MEM* 1000 9.005 MEME 9.006 MEMC øC 14.00U #! Test Tol 14, Sys Tol 0.0048, TUR 2916.667 (>= 4.00). 10.001 5700 29.129mV S 2W 10.002 ACC 700.00ø 8P% 10.003 IEEE [@1281][D3000]RDG?[I] 10.004 MEM* 1000 10.005 MEME 10.006 MEMC øC 16.00U #! Test Tol 16, Sys Tol 0.0056, TUR 2857.143 (>= 4.00). 11.001 5700 33.275mV S 2W 11.002 ACC 800.00ø 8P% 11.003 IEEE [@1281][D3000]RDG?[I] 11.004 MEM* 1000 11.005 MEME 11.006 MEMC øC 18.00U #! Test Tol 18, Sys Tol 0.0064, TUR 2812.500 (>= 4.00). 12.001 5700 37.326mV S 2W 12.002 ACC 900.00ø 8P% 12.003 IEEE [@1281][D3000]RDG?[I] 12.004 MEM* 1000 12.005 MEME 12.006 MEMC øC 20.00U #! Test Tol 20, Sys Tol 0.0072, TUR 2777.778 (>= 4.00). 13.001 5700 41.276mV S 2W 13.002 ACC 1000.00ø 8P% 13.003 IEEE [@1281][D3000]RDG?[I] 13.004 MEM* 1000 13.005 MEME 13.006 MEMC øC 22.00U #! Test Tol 22, Sys Tol 0.008, TUR 2750.000 (>= 4.00). 14.001 HEAD {} 14.002 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 14.003 HEAD {º øF Calibration º} 14.004 HEAD {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 14.005 HEAD ÍÍ øF Calibration ÍÍ 14.006 JMP 15.001 14.007 EVAL 15.001 DISP Select the øF mode on the UUT. 15.002 5700 -1.729mV S 2W 15.003 ACC -50.00ø 8P% 15.004 IEEE [@1281][D3000]RDG?[I] 15.005 MEM* 1000 15.006 MEME 15.007 MEMC øF 4.85U #! Test Tol 4.85, Sys Tol 0.0004, TUR 12125.000 (>= 4.00). 16.001 5700 0.000mV S 2W 16.002 ACC 32.00ø 0.01U 16.003 IEEE [@1281][D3000]RDG?[I] 16.004 MEM* 1000 16.005 MEME 16.006 MEMC øF 3.76U #! Test Tol 3.76, Sys Tol 0.01, TUR 376.000 (>= 4.00). 17.001 5700 1.521mV S 2W 17.002 ACC 100.00ø 8P% 17.003 IEEE [@1281][D3000]RDG?[I] 17.004 MEM* 1000 17.005 MEME 17.006 MEMC øF 4.10U #! Test Tol 4.1, Sys Tol 0.0008, TUR 5125.000 (>= 4.00). 18.001 5700 6.094mV S 2W 18.002 ACC 300.00ø 8P% 18.003 IEEE [@1281][D3000]RDG?[I] 18.004 MEM* 1000 18.005 MEME 18.006 MEMC øF 5.10U #! Test Tol 5.1, Sys Tol 0.0024, TUR 2125.000 (>= 4.00). 19.001 5700 10.561mV S 2W 19.002 ACC 500.00ø 8P% 19.003 IEEE [@1281][D3000]RDG?[I] 19.004 MEM* 1000 19.005 MEME 19.006 MEMC øF 6.10U #! Test Tol 6.1, Sys Tol 0.004, TUR 1525.000 (>= 4.00). 20.001 5700 15.179mV S 2W 20.002 ACC 700.00ø 8P% 20.003 IEEE [@1281][D3000]RDG?[I] 20.004 MEM* 1000 20.005 MEME 20.006 MEMC øF 15.85U #! Test Tol 15.85, Sys Tol 0.0056, TUR 2830.357 (>= 4.00). 21.001 5700 19.887mV S 2W 21.002 ACC 900.00ø 8P% 21.003 IEEE [@1281][D3000]RDG?[I] 21.004 MEM* 1000 21.005 MEME 21.006 MEMC øF 19.35U #! Test Tol 19.35, Sys Tol 0.0072, TUR 2687.500 (>= 4.00). 22.001 5700 24.622mV S 2W 22.002 ACC 1100.00ø 8P% 22.003 IEEE [@1281][D3000]RDG?[I] 22.004 MEM* 1000 22.005 MEME 22.006 MEMC øF 25.60U #! Test Tol 25.6, Sys Tol 0.0088, TUR 2909.091 (>= 4.00). 23.001 5700 29.315mV S 2W 23.002 ACC 1300.00ø 8P% 23.003 IEEE [@1281][D3000]RDG?[I] 23.004 MEM* 1000 23.005 MEME 23.006 MEMC øF 29.60U #! Test Tol 29.6, Sys Tol 0.0104, TUR 2846.154 (>= 4.00). 24.001 5700 33.912mV S 2W 24.002 ACC 1500.00ø 8P% 24.003 IEEE [@1281][D3000]RDG?[I] 24.004 MEM* 1000 24.005 MEME 24.006 MEMC øF 33.60U #! Test Tol 33.6, Sys Tol 0.012, TUR 2800.000 (>= 4.00). 25.001 5700 40.581mV S 2W 25.002 ACC 1800.00ø 8P% 25.003 IEEE [@1281][D3000]RDG?[I] 25.004 MEM* 1000 25.005 MEME 25.006 MEMC øF 39.60U #! Test Tol 39.6, Sys Tol 0.0144, TUR 2750.000 (>= 4.00). 26.001 DISP Select the OFF position on the UUT. 26.002 HEAD {} 26.003 DISP {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 26.003 DISP {º THIS COMPLETES THE VERIFICATION º} 26.003 DISP {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 26.004 END #! T.U.R.s less than 4.00: 0 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.